Abstract
With the crystalline volume fraction from small-angle X-ray scattering (SAXS) and the density of the crystalline phase from wide-angle X-ray diffraction, the amorphous phase density of two representative polyethylenes was calculated as a function of temperature using the absolute total SAXS scattering power or invariant. The density of the amorphous phase in semicrystalline polyethylene is crystallinity independent and is lower than melt-extrapolated values reported in the literature. Model-independent SAXS-based crystallinity values can be calculated with the aid of the densities of the crystalline and amorphous phase and the absolute SAXS invariant. Such model-independent crystallinity values can be used in SAXS curve-shape analysis procedures to obtain the average thickness of the crystalline and amorphous layers also in the case of non-ideal lamellar semicrystalline polymer morphologies for which the number-average long period cannot be retrieved from the maxima in correlation functions or interface distribution functions.
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