Abstract
Abstract Chalcogenide glasses in the system As-S are candidates for very low loss fiber-optic materials. In order to modulate physical properties of such glassese by wellaimed pressure variation the knowledge of the P-T diagram is a precondition. Therefore the aim of this investigation was to cheque the energy-dispersive X-ray diffraction method for low symmetry materials like Realgar (AsS) in order to elaborate P-T diagrams in a time reducing technique.
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