Abstract
We demonstrate the performance of the degradation analysis of N,N″‐Di(1‐naphthyl)‐N,N″‐diphenyl‐(1,1″‐biphenyl)‐4,4″‐diamine (NPB) by laser desorption/ionization time of flight mass spectrometry (LDI‐TOF MS), which is a rapid and accurate technique for material identification. The difference of normal and degraded areas of NPB was clearly shown in mass spectra. Degraded areas were visualized by using LDI‐TOF MS imaging with high spatial resolution of 5 μm. Positive and negative mass spectra of 9,10‐Di(1‐naphthyl)anthracene (α‐ADN) with 98%(HPLC) purity were obtained to determine impurities in OLED materials. The bromine ion that generated impurities during the synthetic process was detected in the negative spectrum of α‐ADN. This technique provides a convenient method to validate the performance and stability of OLED device.
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