Abstract
The top‐emitting white organic light‐emitting diodes (TE‐WOLEDs) containing transparent cathode with various structures of buffer layers were developed. The HATCN effectively protects the underlying organic layers from plasma damage during deposition by sputtering, and the optimized thickness was determined by the UV—Vis absorption spectroscopy. The device with 23 nm HATCN showed higher luminance than other devices. A simple and effective method to determine the buffer layer thickness was discovered. The device using the hybrid buffer layer (HATCN /Mg : Ag) showed the lower voltage and longer lifetime than single buffer layer. The reason is that the hybrid buffer layer have excellent contact and plasma protection performance.
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