Abstract
Oxygen isotope exchange experiments were carried out with a dense La0.6Sr0.4CoO3−δ film (0.5 μm thick) deposited on a Ce0.9Ca0.1O1.9 substrate by a laser ablation method. The isotope exchange profile was measured from the surface into the electrolyte by a secondary ion mass spectrometer (SIMS). The oxygen diffusion through the La0.6Sr0.4CoO3−δ film was fast enough not to make any observable gradient in oxygen isotope concentration inside the film. The surface isotope exchange rate, k*, was calculated from the diffusion profile into the electrolyte layer. The electrochemical impedance, σE, was compared with k*. The oxygen partial pressure dependence of those two parameters were quite similar. The absolute value of k* was larger than expected from σE by a factor of 2 or higher.
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