Oriented Gaussian beams for high-accuracy computation with accuracy control of X-ray propagation through a multi-lens system.

Abstract

A highly accurate method for calculating X-ray propagation is developed. Within this approach, the propagating wave is represented as a superposition of oriented Gaussian beams. The direction of wave propagation in each Gaussian beam agrees with the local direction of propagation of the X-ray wavefront. When calculating the propagation of X-ray waves through lenses, the thin lens approximation is applied. In this approximation, the wave parameters change discontinuously when the wave passes through a lens; the corresponding explicit formulae are derived. The theory is applied to highly accurate calculation of the focusing of X-rays by a system of many beryllium lenses. Fine structure of the wave electric field on the focal plane is revealed and studied. The fine structure is formed due to the diffraction of waves at the edges of the lens apertures. Tools for controlling the calculation accuracy are proposed. The amplitude of the electric field on the focal plane and the focal spot width are shown to be very sensitive to the quality of the calculation, while the best focus position can be obtained even from simple calculations.