Abstract

As an anisotropic material, the unique optoelectronic properties of black phosphorus are obviously anisotropic. Therefore, non-destructive and fast identification of its crystalline orientation is an important condition for its application in optoelectronics research field. Identifying the crystalline orientation of black phosphorus through Ag1 and Ag2 modes under the parallel polarization has high requirements on the Raman system, while in the nonanalyzer configuration, the crystalline orientation of the thick black phosphorus may not be identified through Ag1 and Ag2 modes. This work proposes a new method to identify the crystalline orientation of black phosphorus of different thicknesses. This method is conducted under the nonanalyzer configuration by B2g mode. The results show that B2g mode has a good consistency in the identification of crystalline orientations. In this paper, a theoretical model is established to study the angle-resolved Raman results of B2g mode. The new method can accurately identify the crystalline orientation with different layers of black phosphorus without misidentification.

Highlights

  • Phosphorene, that is black phosphorus of few layers or even monolayer [1], is one of the most attractive two-dimensional (2D) materials

  • Owing to the anisotropic properties, phosphorene can be prospectively applied in a new breed of nano-machine, microelectronic and optoelectronic devices [1,8,12,14,17,20,21] as a core material

  • This paper presented an experimental and theoretical analysis of the identification of the crystalline orientation for multilayer phosphorene samples based on the B2g mode under the nonanalyzer configuration

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Summary

Introduction

Phosphorene, that is black phosphorus of few layers or even monolayer [1], is one of the most attractive two-dimensional (2D) materials. Different from other 2D materials [2], including graphene [3], anisotropy is a common and distinctive feature among the acoustical [4], optical [5], thermal [6], electronical [7,8], and mechanical [9,10] properties of phosphorene, which is intensively dependent on the crystalline orientation. Black phosphorus exhibits many intriguing properties including a highly tunable bandgap [11,12], relatively high carrier mobility [1,13], high on/off ratio [14]. To better explore the applications and characteristics of phosphorene [22], it is crucial to achieve a precise, nondestructive and speedy recognition method of its crystalline orientation

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