Optimum Simple Step-Stress Plans for Accelerated Life Testing

Abstract

This paper presents optimum plans for simple (two stresses) step-stress tests where all units are run to failure. Such plans minimize the asymptotic variance of the maximum likelihood estimator (MLE) of the mean life at a design stress. The life-test model consists of: 1) an exponential life distribution with 2) a mean that is a log-linear function of stress, and 3) a cumulative exposure model for the effect of changing stress. Two types of simple step-stress tests are considered: 1) a time-step test and 2) a failure-step test. A time-step test runs a specified time at the first stress, whereas, a failure-step test runs until a specified proportion of units fail at the first stress. New results include: 1) the optimum time at the first stress for time-step test and 2) the optimum proportion failing at the low stress for a failure-step test, and 3) the asymptotic variance of these optimum tests. Both the optimum time-step and failure-step tests have the same asymptotic variance as the corresponding optimum constant-stress test. Thus step-stress tests yield the same amount of information as constant-stress tests.