Optimization-based multiple target test generation for highly compacted test sets

Abstract

Test compaction is an important aspect in the postproduction test since it is able to reduce the test data and the test costs, respectively. Current ATPG methods treat all faults independently from each other which limits the test compaction capability. This paper proposes a new optimization based SAT-ATPG for compact test set generation. Robust solving algorithms are leveraged to determine fault groups which can be detected by the same test. The proposed technique can be used during initial compact test generation as well as a post-process to increase the compactness of existing test sets, e.g, generated by commercial tools, in an iterative manner. Experimental results on industrial circuits and academic benchmarks show that this technique is able to significantly reduce the pattern count down to 40% for the initial test generation and down to 30% for the iterative reduction.