Abstract
In the present work, optical properties of Ge20S80−xGax thin films using transmission spectra have been described. Thin films of Ge20S80−xGax glassy alloy, obtained from melt quenching technique, were deposited on glass substrate by thermal evaporation technique under a high vacuum conditions (∼10−5 Torr). Glassy nature of thin films has been ascertained by X-ray diffraction pattern. Optical constants were estimated from transmission spectra recorded for the range 200 to 3000 nm using well established Swanepoel’s method. Refractive index has been found to be increase with an increase in Ga and shows a normal dispersion. Increase in refractive index is a consequence of increased polarization and density of the glassy alloy. Extinction coefficient has also been observed and noticed that it decreases with an increase in Ga content. Obtained optical properties are consistent with predicted physical properties of the Ge20S80−xGax glassy alloy.
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