Abstract
The optical properties of ZnTe and ZnS nanocrystals (ZnTe-NC and ZnS-NC) were determined by Spectroscopic Ellipsometry. The nanocrystals were embedded in a SiO2 matrix by ion implantation technique. Their sizes were characterized by transmission electron microscopy. The ZnTe-NC and ZnS-NC were modelled using Critical Points (CPs) dispersion formulas developed by Adachi. Besides the CPs model, the Tauc–Lorentz model was found to be another choice to get a good spectral fitting. Here we demonstrated that these models yield reasonable values of optical constants of II–VI nanocrystals. The best agreement was found with the experimental data over the entire range of 0.6 to 6.5eV.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
