Abstract
The optical erasure dynamics in a batch-thermal fixing scheme ofholographic storage in photorefractive crystals is investigatedtheoretically and experimentally. The inter-batch optical erasure timeconstant τF is introduced to specify the optical erasure tocompensated gratings, and measured in a sophisticated experiment. Theexperimental result shows that τF is much longer than theintra-batch optical erasure time constant τE. The differencebetween τF and τE is fundamental for enhancingnonvolatile storage density.
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