Optical constants and thickness gradients for light intensities in glass substrate layers and for complex electric fields in indium tin oxide (ITO) transparent conductor thin film layer, using Bode and Nyquist wavelength-dependent diagrams

Abstract

Abstract The optical constants of a thin film layer of transparent conductive indium tin oxide (ITO), deposited on a thick glass substrate (G), were obtained for an ITO-G sample using a multilayer matrix method by fitting the regular transmittance and specular reflectance measurements to the collimated equations of the four-flux model, once the optical constants of the glass substrate layer had previously been obtained from a G sample of a single glass substrate layer. The accuracy of the results was validated using a feedback system called the three-extinction matching requirement, that is, obtaining the same extinction coefficients from the optical constants and from the forward and backward collimated differential equations of the four-flux model. To calculate the extinction coefficients of the glass from optical constants, the compression of the wavelength of the incident light in the glass substrate and in the thin ITO film layer was demonstrated, with a thickness less than the wavelength of incident light. The thickness gradients of the forward and backward collimated light intensities, on the glass substrate of the ITOG sample, were compared with those obtained for the single-layer G sample. Then, the thickness gradients for the complex forward and backward electric fields of the ITO thin film layer were obtained and plotted using spectral magnitude and phase Bode plots and new Nyquist plots, i.e. imaginary versus real parts, dependent on wavelength.