Abstract
Ce/Ti/Zr mixed oxide thin films were prepared using sol–gel process with mole ratios from 45/5 to 5/45 of Ti/Zr and 50 of Ce and deposited by dip coating technique. Optical, electrochromic, and structural properties of such films were investigated. The thickness, refractive index, and extinction coefficient of the films were calculated through transmission and reflection measurement by an nkd spectrophotometer. The surface morphology and structural behaviors of the films were characterized by atomic force microscopy and X-ray diffraction. Cyclic voltammetry measurements also were used to study electrochromic properties of these films. The best counter electrode Ce/Ti/Zr oxide thin film is achieved for the sample with a mole ratio of 40/10 of Ti/Zr. The ratio between anodic and cathodic charge is about 0.95 for this sample with a surface roughness of 1.8 nm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
