Abstract
In this contribution, we present a systematic investigation on a series of spiroquaterphenyl compounds optimised for solid state lasing in the near ultraviolet (UV). Amplified spontaneous emission (ASE) thresholds in the order of 1 μ/cm2 are obtained in neat (undiluted) films and blends, with emission peaks at 390±1 nm for unsubstituted and meta-substituted quaterphenyls and 400±4 nm for para-ether substituted quaterphenyls. Mixing with a transparent matrix retains a low threshold, shifts the emission to lower wavelengths and allows a better access to modes having their intensity maximum deeper in the film. Chemical design and blending allow an independent tuning of optical and processing properties such as the glass transition.
Highlights
Spirooligophenyls that are characterised by a spiro linkage of two oligophenyl chromophores have been proposed as efficient organic solid state laser materials [1]–[3]
Chemical variation of the emitting compounds may adapt them for the purpose required. In this contribution we compare a series of novel spiroquaterphenyls for the suitability in distinct organic lasers
Quaterphenyl is chosen as basic chromophore since it allows pumping in the UV below 360 nm while still emitting in the violet spectral range around 400 nm
Summary
Spirooligophenyls that are characterised by a spiro linkage of two oligophenyl chromophores have been proposed as efficient organic solid state laser materials [1]–[3]. A recent major breakthrough in the field of organic lasers, albeit in other material systems, was the demonstration of pumping schemes using inexpensive inorganic diode lasers [7]–[9] which arises more interest for tunable UV emitter materials. Alternative laser geometries for organic solid state lasers are exploited, for instance vertically emitting stacks with Bragg mirrors [10]. In combination with diode laser pumping, small spectroscopic detection systems for analytical applications may be envisaged for arrays of vertical organic lasers. Received January 26, 2015; published February 19, 2015. Static contact angles were measured with a KSV CAM100 system
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of the European Optical Society-Rapid Publications
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
