Abstract
In this paper, we suggest a use of the Gilbert-Elliot (GE) channel model for emulating the burst error characteristics of memory systems such as dynamic random access memory (DRAM). We analyzed the features of the GE channel and obtained experimental results on the error performances of single error correction-double error detection-double adjacent error correction (SEC-DED-DAEC) codes over the GE channel. We confirmed the advantage of SEC-DED-DAEC codes compared with the SEC code over burst error channels.
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