Abstract
Current-voltage (I–V) characteristics of step-edge YBa 2Cu 3O y junctions on MgO(001) substrates were measured over various temperature and frequency ranges to examine the effects of microwave irradiation and magnetic fields on the I–V behaviors of the junctions. In addition to the usual integer Shapiro steps, half-integer Shapiro steps were observed under microwave irradiation. Both the integer and half-Integer Shapiro steps were sensitive to the applied magnetic field and the microwave power. The results are discussed.
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