Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy

Abstract

Abstract Computational modeling of probing the electric double layer (EDL) by scanning electrochemical potential microscopy (SECPM) was carried out in order to evaluate the applicability of this method. The modeling is based on a continuum approach for the electric double layer in dilute solution using the modified Poisson–Boltzmann equation. This model takes into account the finite ion size and prevents steric effects near the charged surface. The approach of the SECPM probe towards a charged electrode, immersed in electrolyte solution, is simulated obtaining the potential profile in the direction normal to the electrode. The effects of the shape and the size of the metallic protrusion at the apex of the probe were studied. A clear dependence of the probe potential on the apex geometry was observed, and correlated to the apex surface charge density distribution. The overlap of the EDLs located at the probe and the electrode is studied by setting different initial open circuit potentials, i.e., different charging, to the probe. We have found that the obtained potential profiles are consequences of the EDL overlap, characterized by an ionic distribution in the gap separating the probe and electrode. Depending on the strength of both EDLs and their polarity, the Debye screening effect severely influences the probe potential.