Novel method for measuring nanofriction by atomic force microscope

Abstract

The authors describe a novel approach to the measurement of nanofriction, and demonstrate the application of the method by measurement of the coefficient of friction for diamondlike carbon (DLC) on DLC, Si on DLC, and Si on Si surfaces. The technique employs an atomic force microscope in a mode in which the tip moves only in the z (vertical) direction and the sample surface is sloped. As the tip moves vertically on the sloped surface, lateral tip slipping occurs, allowing the cantilever vertical deflection and the frictional (lateral) force to be monitored as a function of tip vertical deflection. The advantage of the approach is that cantilever calibration to obtain its spring constants is not necessary. Using this method, the authors have measured friction coefficients, for load range 0<L<6μN, of 0.047±0.002 for Si on Si, 0.0173±0.0009 for Si on DLC, and 0.0080±0.0005 for DLC on DLC. For load range 9<L<13μN, the DLC on DLC coefficient of friction increased to 0.051±0.003.