Abstract
Abstract This paper presents observations on some electronic components where non linear thermal effects play a dominant role. Our interpretation has been assisted by the use of novel numerical modelling techniques which can either solve for a single field variable, or can be used in coupled form to investigate systems where different field variables may interact. Non linear thermal effects appear to be responsible for premature failure in metal film resistors when operated under pulsed conditions. This is thought to be due to the effects of competing thermal paths which involve the metal and non-metal parts of the device. There is also a discussion on some relatively novel ideas concerning the operation of the electric fuse.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
