Abstract
Nonlinear optical properties of silicon nanocrystals (nc-Si)embedded in SiO2 films are investigated usingtime-resolved four-wave mixing technique with a femtosecond laser. Theoff-resonant third-order nonlinear susceptibility χ(3) isobserved to be 1.3×10−10 esu at 800 nm. The relaxationtime of the film is fast as short as 50 fs. The off-resonantnonlinearity is predominantly electronic in origin and enhanced due toquantum confinement.
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