Abstract
Abstract In this work, an efficient non-invasive terahertz pulse technique is proposed and investigated to determine the thickness and refractive index of each layer in an optically thick stratified media. A closed form formulations are derived for simultaneous extraction of the thickness and complex refractive index of each layer with the help of primary reflected signals from the multilayered structure. The proposed technique is numerically tested using a full wave electromagnetic simulator and is experimental verified in the millimeter wave frequency range by utilizing the power peaks corresponding to the primary reflected signals. The numerical and measured results of multilayered samples under test are in good agreement with the reference data. The proposed terahertz pulse technique can be used for non-destructive testing of the multilayered system existing in various industries.
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