Abstract
The transmission of infrared radiation through nanometer-thick layers epitaxially grown on Si(111) substrates has been measured near the longitudinal optical frequency ω LO. We show that a correct interpretation of the experimental spectra must take into account the spatial distribution of the surface charges and that the spectra obtained through non-local calculations including the dispersion of the longitudinal optical (LO) mode in the Γ– L direction compare reasonably well with the experiments.
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