Abstract
Temperature resolved X-ray diffraction using a diffractometer equipped with a high temperature device was applied to the study of the oxidation of Fe-ARMCO below 570°C. The oxidation products are identified in situ and the difference method yields curvesY(T) showing the global changes. These curves were calibrated to the microscopically measured end thickness of the oxide layer obtaining the growthx(T). A calculated curve including the Arrhenius relation was fitted to thex(T) curve yielding activation energy and values of the oxidation rate constant as a function of temperature.
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