Noise spectroscopy: Z-determination by statistical count-rate analysis (Z-scan)

Abstract

We introduce Noise Spectroscopy (NS) and show the results of an analysis of three data-sets demonstrating the feasibility of this technique. The NS effect is first shown to be present in a set of X-ray radiography images of low- and high-Z materials taken using the 6 MV Rapiscan Eagle P60HP portal cargo inspection system. Image-Based NS is, however, relatively insensitive. Using a data-set obtained using a fast plastic scintillator and photo-multiplier tube (PMT), we demonstrate that NS works very well when using fast detectors, fast electronics and waveform digitization. Another data-set was taken using Lutetium–Yttrium Ortho-Silicate (LYSO), which is suitable for use in X-ray cargo radiography. Although LYSO is slower than plastic scintillator, it was shown that NS also works very well using this material, paving the way for NS to be implemented using the primary imaging array of X-ray cargo inspection systems.