Abstract
A measurement technique is described which aids the evaluation of the reliability and quality of complex digital integrated circuits. The power or earth connection to the test circuit is modulated with Gaussian noise and the resultant error rate, measured at the output, may be used either to monitor changes occurring in the circuit or to measure its quality. The basic operating principles and the main components of the measurement system are described and theoretical and experimental results are presented which demonstrate the sensitivity of the method and its ability to respond to changes in the internal circuit which are not readily revealed by other terminal measurements.
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