Abstract
We have implanted xZnF2–(20-x)ZnO–40As2O3–40TeO2 (x = 4 and 20 mol%) glasses with nitrogen ions at different doses. The glass samples were characterized by Rutherford backscattering spectrometry for the concentration depth profiles of the implanted atoms, by SEM analysis for surface morphology, and also by UV–vis absorption spectroscopy. It was observed that in both the glass systems, there is an increase in the values of penetration depth R, projected range Rp, and straggle ΔRp as the N+ implantation dose grows from 5 × 1016 to 5 × 1017 ions/cm2. Scanning electron micrographs show a considerable change in the surface topography between the unimplanted and nitrogen-implanted regions. After nitrogen ion implantation, the transmittance was found to decrease while the absorption edge shifts towards higher wavelength with the increase in the nitrogen implantation doses in both the glass systems. The observed reduction in optical band gap in the both the glass systems can be attributed to the effect of band tailing due to the defects produced during nitrogen implantation.
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