Abstract
A logic diagnosis procedure provides information about the defects that are present in a faulty unit as a set of candidate faults. To obtain smaller, and more accurate, sets of candidate faults, a diagnostic test generation procedure produces a test set that distinguishes fault pairs. This paper observes that large sets of candidate faults are obtained when multiple defects are present in a faulty unit, even if a diagnostic test set is used for logic diagnosis. This points to the possibility that fault pairs do not provide a complete set of targets for diagnostic test generation. This paper analyzes the conditions that cause a large set of candidate faults to be formed under a particular logic diagnosis procedure and suggests new targets for diagnostic test generation. The experimental results for benchmark circuits demonstrate that a diagnostic test set can be improved by adding diagnostic tests for the new targets.
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