Abstract
Previously, we have proposed a strategic dual image (SDI) method to obtain the finite element solution of open boundary magnetic field problems. Also, we have derived a complex permeability from a Chua-type magnetization model. Combination of this complex permeability with the SDI method is now applied to exploit a new high frequency characteristic measurement device for thin magnetic films. Numerical simulation suggests that our new measurement method yields far superior results compared with those of the conventional one.
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