Abstract
Fully depleted, thick CCDs with extended infra-red response have become the sensor of choice for modern sky surveys. However, the charge transport effects in the silicon and associated astrometric distortions could make mapping between the sky coordinates and sensor coordinates non-trivial, and limit the ultimate precision achievable with these sensors. Two new characterization techniques for the CCDs, which both could probe these issues, are discussed: x-ray flat fielding and imaging of pinhole arrays.
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