Abstract
To increase the measurement precision of electron diffraction patterns, a deep upgrade of EMR-102 diffractometer is performed, its operation parameters are studied, and a single-electron detection system with high temporal resolution (up to 60 MHz) and high spatial resolution (several tens of thousands of pixels per 1 A–1) is elaborated. A special software is developed to control the experiment (in particular, using deflection coils and applying synchronous detection of temporal and spatial parameters of each event of electron detector response) and process experimental data. The upgraded diffractometer was used in a series of precise electron diffraction studies, where the accuracy in measuring relative intensities and spatial (angular) resolution were much better than in similar experiments described in the literature.
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