Abstract
This paper describes two new methods of data analysis for two-dimensional nucleation/growth/collision at constant potential. One of these is based on the single potential step perturbation and the other on the double potential step perturbation. Both methods require fewer ad hoc assumptions than the traditional Bewick-Fleischmann-Thirsk analysis. We illustrate the new analyses using such systems as the overpotential deposition of Ag on Ag(100) surfaces, the underpotential deposition of Pb on Ag(111) surfaces, and the anodic film formation of Cd(OH) 2 on Cd amalgam. We prove that, under well defined conditions, it is possible to obtain the nucleation law as direct output from experimental data.
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