Abstract
In a previous paper [Stoica, Popovici & Hubbard (2001),J. Appl. Cryst.34, 343–357], the phase-space analysis of neutron imaging by Bragg reflection from thick bent perfect crystals or multi-wafer assemblies resulted in the derivation of various imaging conditions. An array of new applications becomes possible, including dispersive and non-dispersive neutron imaging at a sub-millimetre spatial resolution. This paper outlines the experimental test results on non-dispersive imaging with thick packets of silicon wafers. The experimental results are compared with Monte Carlo simulations.
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