Abstract

Multiphoton dissociation undergone by the organosilanes 2-chloroethenylsilane and phenylsilane upon irradiation with laser pulses of 20 ps and 4 ns duration at 290 nm has been studied through detection of their spontaneous fluorescence. Atomic Si (4s 1 S 1 0 ) emissions are reported, together with the Swan bands of C 2. Additionally, SiH 2 formed in a two-photon process was observed by laser-induced fluorescence techniques in the photolysis of 2-chloroethenylsilane. The results show a strong selectivity when compared to those obtained previously for far UV irradiation around 200 nm and provide insight into the nature of the photodissociation mechanisms, where the SiH 2 fragment plays a central role.

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