Abstract
We propose scanning near-field optical microscopy as a novel technique for characterizing the ion-implanted patterns fabricated in amorphous silicon carbide (a-SiC:H). Different patterns have been fabricated in a-SiC:H films with a focused Ga +-ion beam system and examined with scanning near-field optical microscopy and atomic force microscopy. Although a considerable thickness change (thinning tendency) has been observed in the ion-irradiated areas, the near-field measurements confirm increases of optical absorption in these areas. The observed values of the optical contrast modulation are sufficient to justify the efficiency of the method for optical data recording using focused ion beams.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.