Abstract
The Imaging Beamline IBL/P05 at the DESY storage ring PETRA III, operated by the Helmholtz-Zentrum Geesthacht, has two dedicated endstations optimized for micro- and nanotomography experiments [1-3]. Here we present the status of the nanotomography endstation, highlight the latest instrumentation upgrades and present first experimental results. In particular in materials science, where structures with ceramics or metallic materials are of interest, X-ray energies of 15 keV and above are required even for sample sizes of several 10 μm in diameter. The P05 imaging beamline is dedicated to materials science and is designed to allow for imaging applications with X-ray energies of 10 to 50 keV. In addition to the full field X-ray microscopy setup, the layout of the nanotomography endstation allows switching to cone-beam configuration. Kinematics for X-ray optics like compound refractive lenses (CRLs), Fresnel zone plates (FZP) or beam-shaping optics are implemented and the installation of a Kirkpatrick Baez-mirror (KB mirror) system is foreseen at a later stage of the beamline development. Altogether this leads to a high flexibility of the nanotomography setup such that the instrument can be tailored to the specific experimental requirements of a range of sample systems.
Highlights
X-ray imaging is a vital tool to study the structure of materials for a wide range of sciences e. g. medicine, biology, archaeology and geology [1,7,8]
We present the status and perspectives of the nanotomography setup at the P05 / Imaging Beamline IBL operated by the Helmholtz Zentrum Geesthacht (HZG) at PETRA III storage ring at DESY in Hamburg (Germany)
The optics hutch of the IBL beamline is equipped with two monochromators: A Double Chrystal Monochromator (DCM) and a Double Multilayer Monochromator (DMM) both allowing for an energy range of 5 – 50 keV
Summary
X-ray imaging is a vital tool to study the structure of materials for a wide range of sciences e. g. medicine, biology, archaeology and geology [1,7,8]. X-ray imaging is a vital tool to study the structure of materials for a wide range of sciences e. Scanning electron microscopy allows imaging in this size regime, but is limited to surface analysis. Transmission electron microscopy (TEM) requires very thin samples of a few hundred nanometres in thickness and only gives very limited information about the bulk structure of a material. X-ray microscopy in contrast is a non-destructive method to acquire 3D information of the bulk sample with resolutions down to below 50 nm in the hard X-ray regime. The high flux at synchrotron sources enables good time resolution and the high coherence opens up a range of phase contrast methods for x-ray microscopy or holotomography for cone – beam setups. We present the status and perspectives of the nanotomography setup at the P05 / Imaging Beamline IBL operated by the Helmholtz Zentrum Geesthacht (HZG) at PETRA III storage ring at DESY in Hamburg (Germany)
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