Abstract

We have studied nanoscale structural evolution processes and phase formation in barrier cerium oxide layers grown from methacrylate solutions on lanthanum aluminate and a nickel-tungsten tape by dip coating. The layers were characterized by atomic force microscopy, scanning electron microscopy, precision electron diffraction, X-ray microanalysis, and X-ray diffraction (including texture analysis). We have investigated nanostructured morphological forms of buffer cerium oxide layers in all synthesis steps: liquid-phase, pyrolytic, and crystalline. We have established a granular character of the nanostructure and determined the type of orientation of the films: 〈111〉 texture with a 〈200〉 additional orientation. Optimal conditions for the synthesis of a barrier layer several tens of nanometers in thickness are proposed.

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