Abstract
In this work, Bi2O3:Al2O3 thin films were prepared on a glass substrate by pulsed laser deposition (PLD) then thermally treated by annealing at temperatures 300, 400, and 500 °C. XRD analysis reveals that all films have a polycrystalline structure of Bi2Al4O9 with the presence of secondary phases of Bi2O3 and Al2O3, the degree of crystallinity increased with annealing temperature, we observed a significant decrease in crystallite size after annealing. SEM and AFM measurements show the films are homogeneous and free of voids and cracks with spherical nanoparticles and relatively high roughness. The optical characteristics show a redshift in the bandgap with increasing annealing temperature. Vickers micro-hardness increased with annealing temperature, the optimum condition is recorded in the films annealed at 500 °C where the highest micro-hardness is recorded and found to be comparable to those of soda-lime glass. These characteristics prove this composite is a promising material in the glass manufacturing process, optoelectronics, and smart windows.
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