Abstract
We present a thermal annealing method for producing micrometer long and dense semi-crystalline fiber structures in poly(3-hexylthiophene) (P3HT) films. The thin film topology and local electrical properties are investigated by conductive atomic force microscopy (c-AFM), and three-dimensional device models are used to illustrate the effects of current spreading, anisotropic mobility and traps. In-plane current flow along high mobility fibers provides a mechanism for c-AFM contrast in fibrous films. The comparison of c-AFM results between the annealed and non-annealed P3HT films suggests that trap effects are pronounced in disordered P3HT thin films prior to thermal annealing. The methodologies we demonstrate here on the archetypal P3HT film can be generalized for understanding the correlation between structure and local electrical properties in a variety of polymer and polymer nanocomposite systems.
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