Abstract
We present an approach in which field-dependent magnetic force microscopy (MFM) is used in order to determine the magnetic properties of individual magnetic nanodots. In this work, the integral value of the cantilever phase shift obtained in vibrating MFM experiment is used as a measure of the field dependent magnetization of single objects. The method accounts for details that are resolved at the 10 nm scale, including fine structures during magnetization reversal. Measurements have been done on a model system of embedded dots since the flatness of the free surface reduces strongly the topographic contaminations. It is shown that the method can easily be applied to investigate both out-of-plane and in-plane magnetized dots.
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