Abstract
AbstractThe prehistoric tools made by natural glass of obsidian can be dated by the recent method of the secondary ion mass spectrometry with the surface saturation using the surface saturation approach (SIMS‐SS). In its initial tests, the method inhered some limitations mainly derived from surface roughness. Indeed, the surface irregularities i.e. presence of wells, cracks, pits, crystals and/or crests, induce uncertain errors in the dating procedure. Here, we provide further images of the Atomic Force Microscopy (AFM) of obsidian surfaces and discuss the impact of AFM results on the SIMS‐SS dating, investigating the problematic non‐smoothed surfaces. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
