Abstract
Modern electronic devices always contain printed circuit boards (PCBs) with multiple layers. If the currents in the PCBs can be visualized without disassembling the electronic devices, the testing and inspection of the devices can be carried out extremely efficiently.This paper proposes a methodology for estimating the current distribution in multi-layered PCBs. The estimation of the current distributions in a PCB from locally measured magnetic fields can always be reduced to solution of an ill-posed inverse problem. This paper reveals that the conventional least squares method give a reasonable solution of our inverse problem. Thus, we succeeded in realizing a highly reliable non-destructive testing methodology for electronic devices.
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