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Abstract
A two-parameter auto-null ellipsometer system was constructed and applied for precise observation of the growth of rare gas films physisorbed on a metal surface in quasi equilibrium condition. We obtained the adsorption isobar of Xe/Ag (111) at P = 2.5×10-6Pa, which shows the layer by layer growth of the Xe film up to the third layer. The relative of polarizability of a Xe atom in the second and the third layer to that of the first layer are 0.94 and 0.91, respectively.
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