Abstract
Thin-gage grain-oriented silicon-iron sheet is expected as a low power loss core material in the future. With lowering thickness the hysteresis loss tends to increase while the eddy current loss decreases. It is important to suppress the increasing tendency of hysteresis loss to realize thin-gage silicon-iron with low power loss. In this paper the mechanism of the thickness dependence of hysteresis loss in (110)[001] oriented silicon-iron was discussed on the basis of the analysis of magnetization process and the experiments using single crystal specimens. It was revealed that the magnetization jump which occurs as a result of the magnetostatic interaction of surface free pole causes a great increase of hysteresis loss at lower thickness when the tilt angle of [001] axis out of the surface is large. The role of the surface closure domain on hysteresis loss was also studied.
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