Abstract
In recent years, many studies has been reported in physic journals concerning the ion-beam analysis of the trace elements and light elements using accelerator induced MeV-range high energy ion-beam. A high-energy ion beam bombardment on a target materialinduces many types of emission of particles and radiations. The detection of these emissions make possible a wide variety of analytical methods. These ion-beam analyses, e.g. PIXE (Proton induced X-ray emission), RBS(Ruatherford backscattering spectrometry), NRA (Neutron reaction analysis), PIGE (Proton induced gamma-ray, emission), PAA (Proton activation analysis), have many advantages in comparison with electron beam probe analytical methods. These ion-beam analyses (IBA) also has unique capabilities for trace element analysis, light element analysis, depth profile analysis, external beam analysis, channeling analysis, ion beam induced luminescence, subsurface fluid inclusion analysis and accelerator mass spectroscopy. These analytical methods are suitable for the mineral science related materials although the application on the mineral science is not yet made in Japan. In view of this situation, the basis of each analytical technique and recent progress on mineralogical applications are reviewed.
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