Abstract
We have fabricated series arrays of intrinsic Josephson junctions of area (2 μm) 2 in thin films of Tl 2Ba 2CaCu 2O 8 grown on vicinal substrates. Measurements of the distribution of the bias current at which a voltage first appears across the array show two peaks in the temperature range between 14 and 20 K. Fitting the data to a simple thermal activation model for a small Josephson junction shows that these peaks correspond to phase-locked switching of two or three junctions respectively. Below 14 K the distribution broadens significantly which we attribute to a crossover to long-junction behaviour. Intrinsic junctions of smaller area ( 0.5×0.7 μ m 2) display no such fluctuations down to 4.2 K, confirming this interpretation.
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