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Abstract
A possibility of applying the multifractal detrended fluctuation analysis (MF-DFA) to the investigation of the gas-sensitivity dependence on the thin-films surface morphology formed using different technological parameters of annealing has been studied. Methods of analyzing the dynamics of complex systems are modified so as to investigate the structure of the metal-containing polyacrylonitrile (PAN) thin films. The long-range power-law correlation in structure of the studied film surface has been studied. The analysis have showed that the time-temperature annealing modes increasing brings to the Hurst parameter value increasing that points to a long-range power-law correlation in structure of the studied film surface.<br />
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