Abstract
Several studies on thermally-grown copper oxide films dealing with their crystalline properties and main phases as functions of the growth temperature have been published; notwithstanding, few research works have proposed a description of the surface morphology of the films using mono-fractal analysis. In this work, copper oxide films were grown by direct thermal oxidation in atmospheric air at different temperatures and times to obtain experimental proof of the phases present in the films by XRD, FTIR and Raman. The textural properties of the copper oxide films were analyzed from atomic force microscopy (AFM) images. The box counting and information fractal dimensions were used to perform the mono-fractal analysis to establish a correlation between the textural properties and the phases of the CuxO films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.