Abstract
Nonlinear AFM dynamics: Despite its importance in many nanomanipulation experiments, most intermittent contact atomic force microscopes do not monitor the nonlinear response of the oscillating cantilever. A recent study provides an effective strategy for measuring and analyzing these nonlinear tip–sample dynamics (see figure). Interestingly, distinct nonlinear regimes are identified – including a chaotic mode – at small tip–sample spacings.
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