Abstract
This paper presents a novel technique for the modeling of capacitive frequency selective surfaces (FSS) with thick metal patches. While these structures are typically analyzed under the hypothesis of infinitely thin metal patches, taking into account the finite thickness of the patches is important in the mm- and submm-wave frequency band, where patches are electrically thick and the thin-patch approximation leads to a shift of the resonance frequency. In addition, the proposed approach permits a better evaluation of conductor losses. The proposed technique is based on the MoM/BI-RME method and permits a computationally efficient and accurate modeling of thick-patch FSS. A validation example is reported and compared to the results obtained with a commercial software, in order to demonstrate the accuracy of the proposed method.
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